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Ganichev, Sergey and Ziemann, E. and Yassievich, Irina and Schmalz, K. and Prettl, Wilhelm (1998) Characterization of deep impurities in semiconductors by terahertz tunnel ionization. In: Ashok, S. and Chevallier, J. and Sumino, K. and Sopori, B. L. and Goetz, W., (eds.) Defect and impurity engineered semiconductors II: symposium held [at the 1998 MRS Spring Meeting], April 13-17, 1998, San Francisco, California, U.S.A. Materials Research Society symposium proceedings, 510. Materials Research Society, Warrendale, Pa., p. 595. ISBN 1-558-99416-5. Fulltext not available.

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