Go to content
UR Home

Publications by Goetz, W.

Up a level
Export as
[feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Date | Item Type | No Grouping
Jump to: 1998
Number of items: 1.


Ganichev, Sergey and Ziemann, E. and Yassievich, Irina and Schmalz, K. and Prettl, Wilhelm (1998) Characterization of deep impurities in semiconductors by terahertz tunnel ionization. In: Ashok, S. and Chevallier, J. and Sumino, K. and Sopori, B. L. and Goetz, W., (eds.) Defect and impurity engineered semiconductors II: symposium held [at the 1998 MRS Spring Meeting], April 13-17, 1998, San Francisco, California, U.S.A. Materials Research Society symposium proceedings, 510. Materials Research Society, Warrendale, Pa., p. 595. ISBN 1-558-99416-5. Fulltext not available.

This list was generated on Fri Nov 27 00:12:11 2015 CET.
  1. Homepage UR

University Library

Publication Server

Contact person
Gernot Deinzer

Phone +49 941 943-2759