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Haug, Thomas and Perzlmaier, Korbinian and Back, Christian (2009) In situ magnetoresistance measurements of ferromagnetic nanocontacts in the Lorentz transmission electron microscope. Physical Review B (PRB) 79 (2), 024414.
Haug, Thomas and Vogl, Anton and Zweck, Josef and Back, Christian (2006) In situ measurements of magnetoresistive effects in ferromagnetic microstructures by Lorentz microscopy. Applied Physics Letters 88, 082506.
Kupidura, D. and Rogge, M. C. and Reinwald, Matthias and Wegscheider, Werner and Haug, Thomas (2006) Spin blockade in lateral quantum dots - Negative differential conductance and spin spectroscopy. physica status solidi b 243 (15), pp. 3864-3868.
Puzic, Aleksandar and Waeyenberge, Bartel Van and Chou, Kang Wei and Fischer, Peter and Stoll, Hermann and Schütz, Gisela and Tyliszczak, Tolek and Rott, Karsten and Brückl, Hubert and Reiss, Günter and Neudecker, Ingo and Haug, Thomas and Buess, Matthias and Back, Christian (2005) Spatially resolved ferromagnetic resonance: Imaging of ferromagnetic eigenmodes. Journal of Applied Physics 97, 10E704.
Haug, Thomas and Back, Christian and Raabe, Jörg and Heun, S. and Locatelli, A. (2005) Magnetic domain walls in T-shaped permalloy microstructures. Applied Physics Letters 86, p. 152503.
Buess, Matthias and Haug, Thomas and Scheinfein, M. and Back, Christian (2005) Micromagnetic Dissipation, Dispersion, and Mode Conversion in Thin Permalloy Platelets. Physical Review Letters (PRL) 94, p. 127205.
Buess, Matthias and Knowles, T. and Höllinger, Rainer and Haug, Thomas and Krey, Uwe and Weiss, Dieter and Pescia, D. and Scheinfein, M. and Back, Christian (2005) Excitations with negative dispersion in a spin vortex. Physical Review B (PRB) 71, p. 104415.
Stoll, Hermann and Puzic, Aleksander and Waeyenberge, Bartel Van and Fischer, Peter and Raabe, Jörg and Buess, Matthias and Haug, Thomas and Höllinger, Rainer and Back, Christian and Weiss, Dieter and Denbeaux, Gregory (2004) High-resolution imaging of fast magnetization dynamics in magnetic nanostructures. Applied Physics Letters 84 (17), pp. 3328-3330.