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Welker, Joachim and Illek, Esther and Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein Journal of Nanotechnology 3, pp. 238-248. Fulltext not available.

This list was generated on Wed Nov 26 01:28:57 2014 CET.
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