Anzahl der Einträge: 5.
2022
2021
Kirpal, Dominik,
Qiu, Jinglan ,
Pürckhauer, Korbinian,
Weymouth, Alfred J. ,
Metz, Michael und
Giessibl, Franz J.
(2021)
Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.
Review of Scientific Instruments 92 (4), 043703.
2020
2019
2016
Ooe, Hiroaki,
Kirpal, Dominik,
Wastl, Daniel S.,
Weymouth, Alfred J. ,
Toyoko, Arai und
Giessibl, Franz J.
(2016)
Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy.
Applied Physics Letters 109, S. 141603.
Diese Liste wurde erzeugt am Fri Apr 19 14:05:47 2024 CEST.