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Publications by Krimmel, E. F.

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Giessibl, Franz J. (2004) Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy. In: Siffert, Paul and Krimmel, E. F., (eds.) Silicon : evolution and future of a technology. Springer, Berlin, pp. 191-204. ISBN 3-540-40546-1. Fulltext not available.

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