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Lechner, Lorenz and Gaaß, Markus and Paila, Antti and Sillanpää, Mika A. and Strunk, Christoph and Hakonen, Pertti J. (2011) Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment. Nanotechnology 22 (12), p. 125203.