Startseite UB

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 12.

Article

Schmid, Martin and Mannhart, Jochen and Giessibl, Franz J. (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Physical Review B (PRB) 77 (4), 045402.
[img]
Preview

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen and Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite. Physical Review Letters (PRL) 94 (5), 056101.
[img]
Preview

Herz, Markus and Schiller, Christian H. and Giessibl, Franz J. and Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), p. 153101. Volltext nicht vorhanden.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen (2004) Force Microscopy with Light-Atom Probes. Science 305 (5682), pp. 380-383. Volltext nicht vorhanden.

Giessibl, Franz J. and Hembacher, Stefan and Herz, Markus and Schiller, C. H. and Mannhart, Jochen (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15 (2), pp. 79-86. Volltext nicht vorhanden.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen and Quate, Calvin F. (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), pp. 12539-12542. Volltext nicht vorhanden.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen (2002) Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum. Applied Surface Science 188 (3-4), pp. 445-449. Volltext nicht vorhanden.

Giessibl, Franz J. and Herz, Markus and Mannhart, Jochen (2002) Friction traced to the single atom. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 99 (19), pp. 12006-12010. Volltext nicht vorhanden.

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations. Annalen der Physik 10 (11-12), pp. 887-910. Volltext nicht vorhanden.

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips (so in der ZS angegeben) Vom Verfasser so:
Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy / Proceedings of NC-AFM 2000.
Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17. Volltext nicht vorhanden.

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), pp. 422-425. Volltext nicht vorhanden.

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357. Volltext nicht vorhanden.

This list was generated on Mon Dec 22 07:23:47 2014 CET.
  1. University

University Library

Publication Server

Contact person
Gernot Deinzer

Telefon 0941 943-2759
Contact