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Gross, Leo and Schuler, Bruno and Mohn, Fabian and Moll, Nikolaj and Repp, Jascha and Meyer, Gerhard (2015) 12. Atomic Resolution on Molecules with Functionalized Tips. In: Morita, Seizo and Giessibl, Franz J. and Meyer, Ernst and Wiesendanger, Roland, (eds.) Noncontact Atomic Force Microscopy: Volume 3. NanoScience and Technology (12). Springer International Publishing, pp. 223-246. ISBN 978-3-319-15587-6. Fulltext not available.

Morita, Seizo and Giessibl, Franz J. and Sugawara, Yasuhiro and Hosoi, Hirotaka and Mukasa, Koichi and Sasahara, Akira and Onishi, Hiroshi (2005) 13. Noncontact Atomic Force Microscopy and its Related Topics. In: Bhushan, Bharat, (ed.) Nanotribology and Nanomechanics An Introduction. Springer, Berlin, pp. 385-411. ISBN 978-3-540-24267-3. Fulltext not available.

Giessibl, Franz J. (2002) 2. Principle of NC-AFM. In: Morita, Seizo and Wiesendanger, Roland and Meyer, Ernst, (eds.) Noncontact atomic force microscopy. Band 1. Nanoscience and technology (2). Springer, Berlin, pp. 11-46. ISBN 3-540-43117-9 . Fulltext not available.

Book

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy. Band 2. Nanoscience and technology. Springer, Heidelberg, Berlin. ISBN 978-3-642-01494-9. Fulltext not available.

This list was generated on Tue Jul 28 12:29:45 2015 CEST.
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