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Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy. Band 2. Nanoscience and technology. Springer, Heidelberg, Berlin. ISBN 978-3-642-01494-9.
Morita, Seizo and Giessibl, Franz J. and Sugawara, Yasuhiro and Hosoi, Hirotaka and Mukasa, Koichi and Sasahara, Akira and Onishi, Hiroshi (2005) 13. Noncontact Atomic Force Microscopy and its Related Topics. In: Bhushan, Bharat, (ed.) Nanotribology and Nanomechanics An Introduction. Springer, Berlin, pp. 385-411. ISBN 978-3-540-24267-3.
Giessibl, Franz J. (2002) 2. Principle of NC-AFM. In: Morita, Seizo and Wiesendanger, Roland and Meyer, Ernst, (eds.) Noncontact atomic force microscopy. Band 1. Nanoscience and technology (2). Springer, Berlin, pp. 11-46. ISBN 3-540-43117-9 .