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Publications by Pielmeier, Florian

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Number of items: 7.


Emmrich, Matthias and Huber, Ferdinand and Pielmeier, Florian and Welker, Joachim and Hofmann, Thomas and Schneiderbauer, Maximilian and Meuer, Daniel and Polesya, Svitlana and Mankovsky, Sergiy and Koedderitzsch, Diemo and Ebert, Hubert and Giessibl, Franz J. (2015) Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters. SCIENCE 348 (6232), pp. 308-311.

Pielmeier, Florian and Landolt, Gabriel and Slomski, Bartosz and Muff, Stefan and Berwanger, Julian and Eich, Andreas and Khajetoorians, Alexander A. and Wiebe, Jens and Aliev, Ziya S. and Babanly, Mahammad B. and Wiesendanger, Roland and Osterwalder, Jürg and Chulkov, Evgueni V. and Giessibl, Franz J. and Dil, J . Hugo (2015) Response of the topological surface state to surface disorder in TIBiSe2. New Journal of Physics 17, 023067.


Pielmeier, Florian (2014) Atomic force microscopy in the picometer regime - resolving spins and non-trivial surface terminations. PhD, Universität Regensburg.

Pielmeier, Florian and Meuer, Daniel and Schmid, Daniel R. and Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. Beilstein Journal of Nanotechnology (5), pp. 407-412. Fulltext not available.

Hofmann, Thomas and Pielmeier, Florian and Giessibl, Franz J. (2014) Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy. Physical Review Letters (PRL) 112 (6), 066101-1-066101-5. Fulltext restricted.


Pielmeier, Florian and Giessibl, Franz J. (2013) Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy. Physical Review Letters (PRL) 110 (26), 266101-1-266101-5.


Giessibl, Franz J. and Pielmeier, Florian and Eguchi, Toyoaki and An, Toshu and Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Physical Review B (PRB) 84 (12), 125409-1-125409-15.

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