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Ganichev, Sergey (2003) Ionization of impurities in semiconductors by intense FIR radiation. In: Svechnikov, Sergey V. and Valakh, Mikhail Y., (eds.) Selected papers on optics and photonics: optical diagnostics of materials and devices for opto-, micro-, and quantum electronics. SPIE proceedings series, 5024. SPIE, Bellingham, Washington, pp. 12-23. ISBN 0-8194-4825-7.

Ganichev, Sergey (2003) Ionization of impurities in semiconductors by intense FIR radiation. In: Svechnikov, Sergey V. and Valakh, Mikhail Y., (eds.) Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics. Proceedings of SPIE, 5024. SPIE, Bellingham, Washington, pp. 12-23. ISBN 0819448257; 9780819448255.

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