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Emmrich, Matthias and Huber, Ferdinand and Pielmeier, Florian and Welker, Joachim and Hofmann, Thomas and Schneiderbauer, Maximilian and Meuer, Daniel and Polesya, Svitlana and Mankovsky, Sergiy and Koedderitzsch, Diemo and Ebert, Hubert and Giessibl, Franz J. (2015) Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters. SCIENCE 348 (6232), pp. 308-311.

Welker, Joachim and Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy. Science 336 (608), pp. 444-449.

Welker, Joachim and Illek, Esther and Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein Journal of Nanotechnology 3, pp. 238-248. Fulltext not available.

Welker, Joachim and de Faria Elsner, Frederico and Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks. Applied Physics Letters 99 (8), 084102.

Weymouth, Alfred J. and Wutscher, Thorsten and Welker, Joachim and Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), p. 226801.

Hofmann, Thomas and Welker, Joachim and Giessibl, Franz J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination. Journal of Vacuum Science & Technology B 28 (3), C4E28. Fulltext not available.

Thesis of the University of Regensburg

Welker, Joachim (2013) Höchstauflösende Kraftmikroskopie mit subatomar definierten Bindungszuständen. Dissertationsreihe der Fakultät für Physik der Universität Regensburg 30, PhD, Universität Regensburg

This list was generated on Sun May 31 00:41:58 2015 CEST.
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