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Femtosecond terahertz time-domain spectroscopy at 36 kHz scan rate using an acousto-optic delay
Abstract
We present a rapid-scan, time-domain terahertz spectrometer employing femtosecond Er:fiber technology and an acousto-optic delay with attosecond precision, enabling scanning of terahertz transients over a 12.4-ps time window at a waveform refresh rate of 36 kHz, and a signal-to-noise ratio of 1.7 × 105. Our approach enables real-time monitoring of dynamic THz processes at unprecedented speeds, which we demonstrate through rapid 2D thickness mapping of a spinning teflon disc at a precision of 10 nm/. The compact, all-optical design ensures alignment-free operation even in harsh environments.
© 2016 AIP Publishing LLC
Received Tue Dec 22 00:00:00 UTC 2015
Accepted Thu Feb 04 00:00:00 UTC 2016
Published online Mon Mar 21 00:00:00 UTC 2016
Acknowledgments:
The authors thank M. Furthmeier for technical assistance. Financial support by the European Research Council (Grant No. 305003) and the Deutsche Forschungsgemeinschaft (LA 3307/1-1), and technical support by Toptica Photonics and Rainbow Photonics is acknowledged.
/content/aip/journal/apl/108/12/10.1063/1.4944459
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2016-03-21
2016-04-12
Abstract
We present a rapid-scan, time-domain terahertz spectrometer employing femtosecond Er:fiber technology and an acousto-optic delay with attosecond precision, enabling scanning of terahertz transients over a 12.4-ps time window at a waveform refresh rate of 36 kHz, and a signal-to-noise ratio of 1.7 × 105. Our approach enables real-time monitoring of dynamic THz processes at unprecedented speeds, which we demonstrate through rapid 2D thickness mapping of a spinning teflon disc at a precision of 10 nm/. The compact, all-optical design ensures alignment-free operation even in harsh environments.
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