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Publikationen von Hembacher, Stefan
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Anzahl der Einträge: 9.
Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F.
(2005)
Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite.
Physical Review Letters (PRL) 94 (5), 056101-1-056101-4.
Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen
(2004)
Force Microscopy with Light-Atom Probes.
Science 305 (5682), S. 380-383.
Giessibl, Franz J., Hembacher, Stefan, Herz, Markus, Schiller, C. H. und Mannhart, Jochen
(2004)
Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor.
Nanotechnology 15 (2), S. 79-86.
Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F.
(2003)
Revealing the hidden atom in graphite by low-temperature atomic force microscopy.
Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), S. 12539-12542.
Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen
(2002)
Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum.
Applied Surface Science 188 (3-4), S. 445-449.
Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen
(2001)
Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations.
Annalen der Physik 10 (11-12), S. 887-910.
Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen
(2001)
Imaging silicon by atomic force microscopy with crystallographically oriented tips.
Applied Physics A: Materials Science & Processing 72 (Suppl1), S. 15-17.
Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen
(2000)
Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy.
Science 289 (5478), S. 422-425.
Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen
(1999)
Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy.
Applied Surface Science 140 (3-4), S. 352-357.
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