Entries of Naftel, S. J on the publication server
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2002
Sammynaiken, R., Naftel, S. J, Sham, T. K., Cheah, K. W., Averboukh, B., Huber, Rupert, Shen, Y. R., Qin, G. G., Ma, Z. C. and Zong, W. H.
(2002)
Structure and electronic properties of SiO₂/Si multilayer superlattices: Si K edge and L₃,₂ edge x-ray absorption fine structure study.
Journal of Applied Physics 92 (6), pp. 3000-3006.
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