Entries of Urdampilleta, M. on the publication server

Hutin, L., Lundberg, T., Chatterjee, A., Crippa, A., Li, J., Maurand, R., Jehl, X., Sanquer, M., Gonzalez-Zalba, M. F., Kuemmeth, Ferdinand , Niquet, Y.-M., Bertrand, B., De Franceschi, S., Urdampilleta, M., Meunier, T., Vinet, M., Chanrion, E., Bohuslavskyi, H., Ansaloni, F., Yang, T.-Y., Michniewicz, J., Niegemann, D. J. and Spence, C. (2019) Gate reflectometry for probing charge and spin states in linear Si MOS split-gate arrays. In: 2019 IEEE International Electron Devices Meeting (IEDM), 7-11 Dec. 2019, San Francisco.