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Publications by Weymouth, Alfred J.

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Jump to: 2019 | 2018 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011
Number of items: 15.

2019

Seeholzer, Theresa , Gretz, Oliver , Giessibl, Franz J. and Weymouth, Alfred J. (2019) A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data. New Journal of Physics 21 (8), 083007. Fulltext restricted.

Pürckhauer, Korbinian, Kirpal, Dominik, Weymouth, Alfred J. and Giessibl, Franz J. (2019) Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Revealing That Sulfur Is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions. ACS Applied Nano Materials 2 (5), pp. 2593-2598. Fulltext not available.

2018

Pürckhauer, Korbinian , Weymouth, Alfred J. , Pfeffer, Katharina, Kullmann, Lars, Mulvihill, Estefania, Krahn, Michael P. , Müller, Daniel J. and Giessibl, Franz J. (2018) Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors. Scientific Reports 8 (1), p. 9330. Fulltext restricted.

2016

Ooe, Hiroaki, Kirpal, Dominik, Wastl, Daniel S., Weymouth, Alfred J. , Toyoko, Arai and Giessibl, Franz J. (2016) Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy. Applied Physics Letters 109, p. 141603.

2015

Huber, Ferdinand, Matencio, Sonia, Weymouth, Alfred J., Ocal, Carmen, Barrena, Esther and Giessibl, Franz J. (2015) Intramolecular Force Contrast and Dynamic Current-Distance Measurements at Room Temperature. Physical Review Letters 115 (6), 066101-1-066101-4.

Emmrich, Matthias, Schneiderbauer, Maximilian, Huber, Ferdinand, Weymouth, Alfred J., Okabayashi, Norio and Giessibl, Franz J. (2015) Force Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM Tip. Physical Review Letters (PRL) 114, 146101-146101-5.

Wastl, Daniel S., Judmann, Michael, Weymouth, Alfred J. and Giessibl, Franz J. (2015) Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips. ACS Nano 9 (4), pp. 3858-3865. Fulltext not available.

2014

Schneiderbauer, Maximilian, Emmrich, Matthias, Weymouth, Alfred J. and Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy
Contrast via Short-Range Electrostatic Forces.
Physical Review Letters (PRL) 112, 166102-1-166102-5.

Wastl, Daniel S., Weymouth, Alfred J. and Giessibl, Franz J. (2014) Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy. ACS NANO 8 (5), pp. 5233-5239. Fulltext not available.

Weymouth, Alfred J., Hofmann, Thomas and Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy. Science 343 (6175), 1120-1-1120-5.

2013

Weymouth, Alfred J., Meuer, Daniel, Mutombo, Pingo, Wutscher, Thorsten, Ondracek, Martin, Jelinek, Pavel and Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction. Physical Review Letters 111 (12), p. 126103.

Welker, Joachim, Weymouth, Alfred J. and Giessibl, Franz J. (2013) The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy. ACS NANO 7 (8), pp. 7377-7382. Fulltext not available.

Wastl, Daniel S., Weymouth, Alfred J. and Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B (PRB) 87 (24), 245415-1-245415-10.

2012

Wutscher, Thorsten, Weymouth, Alfred J. and Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current. Physical Review B (PRB) 85 (19), 195426-1-195426-6.

2011

Weymouth, Alfred J., Wutscher, Thorsten, Welker, Joachim, Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), 226801-1-226801-4.

This list was generated on Thu Aug 13 10:55:35 2020 CEST.
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