Go to content
UR Home

In-plane Raman scattering of [001]-grown Si/Ge superlattices

Schorer, R., Wegscheider, Werner, Eberl, Karl, Kasper, E., Kibbel, H. and Abstreiter, Gerhard (1992) In-plane Raman scattering of [001]-grown Si/Ge superlattices. Thin Solid Films 222 (1-2), pp. 269-273.

Download (422kB) - Repository staff only
Date of publication of this fulltext: 26 Oct 2009 14:07

at publisher (via DOI)


We present a micro-Raman study of short-period [001] Si/Ge superlattices. The submicron spatial resolution of this technique enables in-plane scattering geometries, thus overcoming the severe limitations of conventional Raman set-ups for backscattering from the growth surface, where only longitudinal modes can be observed. We were able to study the complete phonon spectrum consisting of confined ...


Export bibliographical data

Item type:Article
Date:16 December 1992
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number:
Dewey Decimal Classification:500 Science > 530 Physics
Created at the University of Regensburg:Unknown
Item ID:10009
Owner only: item control page


Downloads per month over past year

  1. Homepage UR

University Library

Publication Server


Publishing: oa@ur.de

Dissertations: dissertationen@ur.de

Research data: daten@ur.de

Contact persons