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Heinzel, Thomas H. ; Held, R. ; Lüscher, S. ; Ensslin, Klaus ; Wegscheider, Werner

Semiconductor nanostructures with short depletion length and stacked gates, patterned with an atomic force microscope

Heinzel, Thomas H., Held, R., Lüscher, S., Ensslin, Klaus and Wegscheider, Werner (2000) Semiconductor nanostructures with short depletion length and stacked gates, patterned with an atomic force microscope. Physica E Low-dimensional Systems and Nanostructures 7 (3-4), pp. 860-863.

Date of publication of this fulltext: 30 Nov 2009 13:22
Article
DOI to cite this document: 10.5283/epub.11039


Abstract

We have investigated the electronic properties of the confining potentials obtained by oxidizing the surface of Ga[Al]As heterostructures with an atomic force microscope. From magnetotransport measurements on quantum wires at liquid-helium temperatures we find an extremely small lateral depletion length of (15±5) nm as well as a specularity of the boundary scattering above 95%. Furthermore, we ...

We have investigated the electronic properties of the confining potentials obtained by oxidizing the surface of Ga[Al]As heterostructures with an atomic force microscope. From magnetotransport measurements on quantum wires at liquid-helium temperatures we find an extremely small lateral depletion length of (15±5) nm as well as a specularity of the boundary scattering above 95%. Furthermore, we demonstrate that this patterning technique for in-plane gates can be combined with top gate electrodes. Sufficiently thin top gates consisting of a suitable material can be patterned as well with an atomic force microscope, and the top gate structures can be aligned with respect to the in-plane gates.



Involved Institutions


Details

Item typeArticle
Journal or Publication TitlePhysica E Low-dimensional Systems and Nanostructures
Publisher:Elsevier
Volume:7
Number of Issue or Book Chapter:3-4
Page Range:pp. 860-863
DateMay 2000
InstitutionsPhysics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number
ValueType
10.1016/S1386-9477(00)00077-1DOI
Classification
NotationType
07.79.Lh; 73.20.Dx; 81.05.EdPACS
KeywordsAtomic force microscope; Semiconductor nanostructures; Nanolithography
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedUnknown
Created at the University of RegensburgUnknown
Item ID11039

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