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Semiconductor nanostructures with short depletion length and stacked gates, patterned with an atomic force microscope
Heinzel, Thomas H., Held, R., Lüscher, S., Ensslin, Klaus and Wegscheider, Werner (2000) Semiconductor nanostructures with short depletion length and stacked gates, patterned with an atomic force microscope. Physica E Low-dimensional Systems and Nanostructures 7 (3-4), pp. 860-863.Date of publication of this fulltext: 30 Nov 2009 13:22
Article
DOI to cite this document: 10.5283/epub.11039
Abstract
We have investigated the electronic properties of the confining potentials obtained by oxidizing the surface of Ga[Al]As heterostructures with an atomic force microscope. From magnetotransport measurements on quantum wires at liquid-helium temperatures we find an extremely small lateral depletion length of (15±5) nm as well as a specularity of the boundary scattering above 95%. Furthermore, we ...
We have investigated the electronic properties of the confining potentials obtained by oxidizing the surface of Ga[Al]As heterostructures with an atomic force microscope. From magnetotransport measurements on quantum wires at liquid-helium temperatures we find an extremely small lateral depletion length of (15±5) nm as well as a specularity of the boundary scattering above 95%. Furthermore, we demonstrate that this patterning technique for in-plane gates can be combined with top gate electrodes. Sufficiently thin top gates consisting of a suitable material can be patterned as well with an atomic force microscope, and the top gate structures can be aligned with respect to the in-plane gates.
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Details
| Item type | Article | ||||
| Journal or Publication Title | Physica E Low-dimensional Systems and Nanostructures | ||||
| Publisher: | Elsevier | ||||
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| Volume: | 7 | ||||
| Number of Issue or Book Chapter: | 3-4 | ||||
| Page Range: | pp. 860-863 | ||||
| Date | May 2000 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider | ||||
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| Keywords | Atomic force microscope; Semiconductor nanostructures; Nanolithography | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Unknown | ||||
| Created at the University of Regensburg | Unknown | ||||
| Item ID | 11039 |
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