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In-plane Gate Single Electron Transistor Fabricated by AFM Lithography
Lüscher, S., Fuhrer, A., Held, R., Heinzel, Thomas H., Ensslin, Klaus, Wegscheider, Werner and Bichler, Max (2000) In-plane Gate Single Electron Transistor Fabricated by AFM Lithography. Journal of Low Temperature Physics 118 (5-6), pp. 333-342.Date of publication of this fulltext: 30 Nov 2009 13:23
Article
DOI to cite this document: 10.5283/epub.11041
Abstract
Coulomb blockade is observed in semiconductor quantum dotsfabricated by scanning probe lithography. We demonstrate thatby combining top gates with in-plane gates, the lithographicshape of a dot can be transferred into the electron gas withhigh accuracy. Furthermore, by applying voltages to the in-plane gates, the number of electrons on the dot can be changedby more than 70 without changing its ...
Coulomb blockade is observed in semiconductor quantum dotsfabricated by scanning probe lithography. We demonstrate thatby combining top gates with in-plane gates, the lithographicshape of a dot can be transferred into the electron gas withhigh accuracy. Furthermore, by applying voltages to the in-plane gates, the number of electrons on the dot can be changedby more than 70 without changing its shape. Transportmeasurements in high magnetic fields and with positive topgate voltages applied indicate that the potential walls of thenanostructure can be made very steep.
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| Item type | Article | ||||
| Journal or Publication Title | Journal of Low Temperature Physics | ||||
| Publisher: | Kluwer | ||||
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| Volume: | 118 | ||||
| Number of Issue or Book Chapter: | 5-6 | ||||
| Page Range: | pp. 333-342 | ||||
| Date | May 2000 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider | ||||
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| Classification |
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| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Unknown | ||||
| Created at the University of Regensburg | Unknown | ||||
| Item ID | 11041 |
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