Microstrip line ferromagnetic resonance and Brillouin light scattering investigations of magnetic properties of Co2MnGe Heusler thin films

URN to cite this document:: urn:nbn:de:bvb:355-epub-149156
DOI to cite this document:: 10.5283/epub.14915

Belmeguenai, M. ; Zighem, F. ; Roussigne, Y. ; Chérif, S.-M. ; Moch, P. ; Westerholt, K. ; Woltersdorf, Georg ; Bayreuther, Günther

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Date of publication of this fulltext: 27 May 2010 08:58

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Abstract

Co2MnGe films of different thicknesses (34, 55, and 83 nm) were grown by rf sputtering at 400 degrees C on single-crystal Al2O3 corundum substrates showing an in-plane c axis. Their dynamic magnetic properties were studied using conventional and microstrip line (MS) ferromagnetic resonances (FMRs), as well as Brillouin light scattering (BLS) techniques. The effective ...