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Structural and magnetic properties of NiMnSb/InGaAs/InP(001)

URN to cite this document:
urn:nbn:de:bvb:355-epub-149412
Koveshnikov, A ; Woltersdorf, Georg ; Liu, JQ ; Kardasz, B ; Mosendz, O ; Heinrich, B ; Kavanagh, KL ; Bach, P ; Bader, AS ; Schumacher, C ; Ruster, C ; Gould, C ; Schmidt, G ; Molenkamp, LW ; Kumpf, C
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Date of publication of this fulltext: 27 May 2010 07:34


Abstract

The structural and magnetic properties of NiMnSb films, 5-120 nm thick, grown on InGaAs/InP(001) substrates by molecular-beam epitaxy, were studied by x-ray diffraction, transmission electron microscopy (TEM), and ferromagnetic resonance (FMR) techniques. X-ray diffraction and TEM studies show that the NiMnSb films had the expected half-Heusler structure, and films up to 120 nm were ...

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