Structural and magnetic properties of NiMnSb/InGaAs/InP(001)

URN to cite this document:: urn:nbn:de:bvb:355-epub-149412
DOI to cite this document:: 10.5283/epub.14941

Koveshnikov, A. ; Woltersdorf, Georg ; Liu, J. Q. ; Kardasz, B. ; Mosendz, O. ; Heinrich, B. ; Kavanagh, K. L. ; Bach, P. ; Bader, A. S. ; Schumacher, C. ; Ruster, C. ; Gould, C. ; Schmidt, G. ; Molenkamp, L. W. ; Kumpf, C.

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Date of publication of this fulltext: 27 May 2010 07:34

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Abstract

The structural and magnetic properties of NiMnSb films, 5-120 nm thick, grown on InGaAs/InP(001) substrates by molecular-beam epitaxy, were studied by x-ray diffraction, transmission electron microscopy (TEM), and ferromagnetic resonance (FMR) techniques. X-ray diffraction and TEM studies show that the NiMnSb films had the expected half-Heusler structure, and films up to 120 nm ...