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Imaging ellipsometry of graphene

URN to cite this document:
urn:nbn:de:bvb:355-epub-187921
DOI to cite this document:
10.5283/epub.18792
Wurstbauer, Ulrich ; Röling, Christian ; Wurstbauer, Ursula ; Wegscheider, Werner ; Vaupel, Matthias ; Thiesen, Peter H. ; Weiss, Dieter
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Date of publication of this fulltext: 15 Dec 2010 12:35


Abstract

Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene’s optical properties can be investigated.


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