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Magnetization profile at the Fe/GaAs(001)-4x6 interface

Giovanelli, Luca, Tian, C., Gastelois, P., Panaccione, G., Fabrizioli, M., Hochstrasser, M., Galaktionov, M., Back, Christian and Rossi, G. (2004) Magnetization profile at the Fe/GaAs(001)-4x6 interface. Physica B Condensed Matter 345 (1-4), pp. 177-180.

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The magnetization of a thin Fe film epitaxially grown on GaAs(0 0 1)-4×6 was studied at different depths from the metal/semiconductor interface using a single layer of Fe0.5Co0.5 as a marker layer through a double-wedge Fe film. By measuring the X-ray magnetic circular dichroism spectroscopy at the L2,3 of Co, the magnetic response of the film could be sensed at different distances from the ...


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Item type:Article
Date:March 2004
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back
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Keywords:Fe; Co; GaAs; X-ray magnetic circular dichroism; Spin injection
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:1915
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