Magnetization profile at the Fe/GaAs(001)-4x6 interface

Giovanelli, Luca, Tian, C., Gastelois, P., Panaccione, G., Fabrizioli, M., Hochstrasser, M., Galaktionov, M., Back, Christian und Rossi, G. (2004) Magnetization profile at the Fe/GaAs(001)-4x6 interface. Physica B Condensed Matter 345 (1-4), S. 177-180.

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Andere URL zum Volltext: http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TVH-4BFXX2J-2&_user=616165&_coverDate=03%2F01%2F2004&_rdoc=46&_fmt=summary&_orig=browse&_srch=doc-info(%23toc%235535%232004%23996549998%23482682%23FLA%23display%23Volume)&_cdi=5535&_sort=d&_docanc

Zusammenfassung

The magnetization of a thin Fe film epitaxially grown on GaAs(0 0 1)-4×6 was studied at different depths from the metal/semiconductor interface using a single layer of Fe0.5Co0.5 as a marker layer through a double-wedge Fe film. By measuring the X-ray magnetic circular dichroism spectroscopy at the L2,3 of Co, the magnetic response of the film could be sensed at different distances from the ...

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