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Electronic transport properties of electron- and hole-doped semiconducting C1b Heusler compounds: NiTi1−xMxSn (M=Sc, V)
Ouardi, Siham, Fecher, Gerhard H., Balke, Benjamin, Kozina, Xenia, Stryganyuk, Gregory, Felser, Claudia, Lowitzer, Stephan, Koedderitzsch, Diemo, Ebert, Hubert und Ikenaga, Eiji (2010) Electronic transport properties of electron- and hole-doped semiconducting C1b Heusler compounds: NiTi1−xMxSn (M=Sc, V). Physical Review B (PRB) 82, 085108.Veröffentlichungsdatum dieses Volltextes: 21 Feb 2011 07:58
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.19678
Zusammenfassung
The substitutional series of Heusler compounds NiTi1−xMxSn (where M=Sc,V and 0<x≤0.2) were synthesized and investigated with respect to their electronic structure and transport properties. The results show the possibility to create n-type and p-type thermoelectrics within one Heusler compound. The electronic structure and transport properties were calculated by all-electron ab initio methods and ...
The substitutional series of Heusler compounds NiTi1−xMxSn (where M=Sc,V and 0<x≤0.2) were synthesized and investigated with respect to their electronic structure and transport properties. The results show the possibility to create n-type and p-type thermoelectrics within one Heusler compound. The electronic structure and transport properties were calculated by all-electron ab initio methods and compared to the measurements. Hard x-ray photoelectron spectroscopy was carried out and the results are compared to the calculated electronic structure. Pure NiTiSn exhibits massive “in gap” states containing about 0.1 electrons per cell. The comparison of calculations, x-ray diffraction, and photoemission reveals that Ti atoms swapped into the vacant site are responsible for these states. The carrier concentration and temperature dependence of electrical conductivity, Seebeck coefficient, and thermal conductivity were investigated in the range from 10 to 300 K. The experimentally determined electronic structure and transport measurements agree well with the calculations. The sign of the Seebeck coefficient changes from negative for V to positive for Sc substitution. The high n-type and low p-type power factors are explained by differences in the chemical-disorder scattering-induced electric resistivity. Major differences appear because p-type doping (Sc) creates holes in the triply degenerate valence band at Γ whereas n-type doping (V) fills electrons in the single conduction band above the indirect gap at X what is typical for all semiconducting transition-metal-based Heusler compounds with C1b structure.
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| Dokumentenart | Artikel | ||||
| Titel eines Journals oder einer Zeitschrift | Physical Review B (PRB) | ||||
| Verlag: | American Physical Society | ||||
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| Band: | 82 | ||||
| Seitenbereich: | 085108 | ||||
| Datum | 11 August 2010 | ||||
| Institutionen | Nicht ausgewählt | ||||
| Identifikationsnummer |
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| Klassifikation |
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| Dewey-Dezimal-Klassifikation | 500 Naturwissenschaften und Mathematik > 530 Physik | ||||
| Status | Veröffentlicht | ||||
| Begutachtet | Ja, diese Version wurde begutachtet | ||||
| An der Universität Regensburg entstanden | Nein | ||||
| URN der UB Regensburg | urn:nbn:de:bvb:355-epub-196786 | ||||
| Dokumenten-ID | 19678 |
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