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Analysis of electron diffraction patterns from carbon nanotubes with image processing to determine structural parameters

Senninger, Dominik (2011) Analysis of electron diffraction patterns from carbon nanotubes with image processing to determine structural parameters. PhD, Universität Regensburg.

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Date of publication of this fulltext: 06 Dec 2011 07:30

Abstract (English)

In this PhD-thesis a method was developed, which offers the possibility to analyze electron diffraction patterns from carbon nanotubes automatically with a computer program to determine the chiral indices n and m. Diffraction patterns of single-walled nanotubes can be evaluated as well as images of multi-walled tubes or bundles of tubes. To be able to verify the results of the algorithm, a ...


Translation of the abstract (German)

Im Rahmen dieser Dissertation wurde eine Methode entwickelt, die die Möglichkeit bietet, Elektronenbeugungsaufnahmen von Kohlenstoffnanoröhrchen mit einem Algorithmus automatisch auszuwerten, um die chiralen Indizes n und m zu bestimmen. Sowohl Beugungsbilder von einwandigen Nanoröhrchen als auch Bilder von mehrwandigen Röhrchen und Bündeln können ausgewertet werden. Um die Ergebnisse des ...


Export bibliographical data

Item type:Thesis of the University of Regensburg (PhD)
Date:6 December 2011
Referee:Prof. Dr. Elmar W. Lang and Prof. Dr. Christoph Strunk
Date of exam:7 November 2011
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk
Biology, Preclinical Medicine > Institut für Biophysik und physikalische Biochemie > Prof. Dr. Elmar Lang
Interdisciplinary Subject Network:Not selected
Keywords:Carbon nanotubes Electron diffraction Image Processing
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:22789
Owner only: item control page


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