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Structural and morphological TEM characterization of GaAs based nanowires

Soda, Marcello (2012) Structural and morphological TEM characterization of GaAs based nanowires. PhD, Universität Regensburg.

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Date of publication of this fulltext: 30 Nov 2012 09:17

Abstract (English)

The question of a structural and morphological characterization of GaAs based nanowires is the research interest of this thesis. For this purpose standard and analytical transmission electron microscopy techniques were employed. New investigation methodologies are introduced in order to obtain a reliable interpretation of the results. The principal motivation on developing a new investigation ...


Translation of the abstract (German)

Diese Arbeit beschäftigt sich mit der strukturellen und morphologischen Charakterisierung von GaAs basierten Nanodrähten. Die Untersuchungen werden mit standard und analytische Transmissionselektronenmikroskopie-Techniken durchgeführt. Neue Untersuchungsmethoden werden eingeführt um eine zuverlässige Interpretation der Ergebnisse zu erzielen. Die Berücksichtigung bei der strukturellen und ...


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Item type:Thesis of the University of Regensburg (PhD)
Date:30 November 2012
Referee:Prof. Dr. Josef Zweck
Date of exam:3 February 2012
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Josef Zweck
Keywords:GaAs, Nanowire, TEM
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:25592
Owner only: item control page


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