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Weak localization and Raman study of anisotropically etched graphene antidots

Oberhuber, Florian, Blien, Stefan, Heydrich, Stefanie, Yaghobian, Fatemeh, Korn, Tobias, Schueller, Christian, Strunk, Christoph, Weiss, Dieter and Eroms, Jonathan (2013) Weak localization and Raman study of anisotropically etched graphene antidots. Applied Physics Letters 14 (103), pp. 143111-143115.

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Date of publication of this fulltext: 07 Oct 2013 11:11

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Other URL: http://link.aip.org/link/doi/10.1063/1.4824025


Abstract

We study a crystallographic etching process of graphene nanostructures, where zigzag edges can be prepared selectively. The process involves heating exfoliated single-layer graphene samples with a predefined pattern of antidot arrays in an argon atmosphere at 820 ∘C, which selectively removes carbon atoms located on armchair sites. Atomic force microscopy and scanning electron microscopy cannot ...

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Item type:Article
Date:1 October 2013
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group Christian Schüller
Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk
Projects:SFB 689: Spinphänomene in reduzierten Dimensionen, GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Identification Number:
ValueType
10.1063/1.4824025DOI
Classification:
NotationType
78.30.Na, 81.16.Rf, 81.40.Gh, 81.65.Cf, 61.48.GhPACS
Keywords:atomic force microscopy, graphene, heat treatment, nanofabrication, nanopatterning, nanostructured materials, quantum dots, Raman spectra, scanning electron microscopy, sputter etching, weak localisation
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:28888
Owner only: item control page

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