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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-333655
- DOI to cite this document:
- 10.5283/epub.33365
Alternative links to fulltext:DOI
Abstract
Recent experimental investigations on the reduction of internal quantum efficiency with increasing current density in (AlInGa)N quantum well structures show that Auger recombination is a significant contributor to the so-called "droop" phenomenon. Using photoluminescence (PL) test structures, we find Auger processes are responsible for at least 15 % of the measured efficiency droop. Furthermore, ...

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