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Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device

Müller, Knut, Ryll, Henning, Ordavo, Ivan, Ihle, Sebastian, Strüder, Lothar, Volz, Kerstin and Zweck, Josef (2012) Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device. Applied Physics Letters 101, p. 212110.

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Abstract

A high-speed direct electron detection system is introduced to the field of transmission electron microscopy and applied to strain measurements in semiconductor nanostructures. In particular, a focused electron probe with a diameter of 0.5 nm was scanned over a fourfold quantum layer stack with alternating compressive and tensile strain and diffracted discs have been recorded on a ...

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Item type:Article
Date:2012
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Josef Zweck
Identification Number:
ValueType
10.1063/1.4767655DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:34759
Owner only: item control page

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