Direkt zum Inhalt

Owner only: item control page
Mooshammer, Fabian ; Sandner, Fabian ; Huber, Markus A. ; Zizlsperger, Martin ; Weigand, Helena ; Plankl, Markus ; Weyrich, Christian ; Lanius, Martin ; Kampmeier, Jörn ; Mussler, G. ; Grützmacher, D. ; Boland, Jessica L. ; Cocker, Tyler L. ; Huber, Rupert

Nanoscale Near-Field Tomography of Surface States on (Bi0.5Sb0.5)2Te3

Mooshammer, Fabian , Sandner, Fabian, Huber, Markus A. , Zizlsperger, Martin, Weigand, Helena, Plankl, Markus, Weyrich, Christian, Lanius, Martin, Kampmeier, Jörn, Mussler, G., Grützmacher, D., Boland, Jessica L. , Cocker, Tyler L. and Huber, Rupert (2018) Nanoscale Near-Field Tomography of Surface States on (Bi0.5Sb0.5)2Te3. Nano Letters 18 (12), pp. 7515-7523.

Date of publication of this fulltext: 22 Nov 2018 09:36
Article
DOI to cite this document: 10.5283/epub.38043


Abstract

Three-dimensional topological insulators (TIs) have attracted tremendous interest for their possibility to host massless Dirac Fermions in topologically protected surface states (TSSs), which may enable new kinds of high-speed electronics. However, recent reports have outlined the importance of band bending effects within these materials, which results in an additional two-dimensional electron ...

Three-dimensional topological insulators (TIs) have attracted tremendous interest for their possibility to host massless Dirac Fermions in topologically protected surface states (TSSs), which may enable new kinds of high-speed electronics. However, recent reports have outlined the importance of band bending effects within these materials, which results in an additional two-dimensional electron gas (2DEG) with finite mass at the surface. TI surfaces are also known to be highly inhomogeneous on the nanoscale, which is masked in conventional far-field studies. Here, we use near-field microscopy in the mid infrared spectral range to probe the local surface properties of customtailored (Bi0.5Sb0.5)(2)Te-3 structures with nanometer precision in all three spatial dimensions. Applying nanotomography and nanospectroscopy, we reveal a few-nanometer-thick layer of high surface conductivity and retrieve its local dielectric function without assuming any model for the spectral response. This allows us to directly distinguish between different types of surface states. An intersubband transition within the massive 2DEG formed by quantum confinement in the bent conduction band manifests itself as a sharp, surface-bound, Lorentzian-shaped resonance. An additional broadband background in the imaginary part of the dielectric function may be caused by the TSS. Tracing the intersubband resonance with nanometer spatial precision, we observe changes of its frequency, likely originating from local variations of doping or/and the mixing ratio between Bi and Sb. Our results highlight the importance of studying the surfaces of these novel materials on the nanoscale to directly access the local optical and electronic properties via the dielectric function.



Involved Institutions


Linked items

  • [img]
    Preview
    Mooshammer, Fabian , Sandner, Fabian, Huber, Markus A. , Zizlsperger, Martin, Weigand, Helena, Plankl, Markus, Weyrich, Christian, Lanius, Martin, Kampmeier, Jörn, Mussler, G., Grützmacher, D., Boland, Jessica L. , Cocker, Tyler L. and Huber, Rupert (2018) Nanoscale Near-Field Tomography of Surface States on (Bi0.5Sb0.5)2Te3. Nano Letters 18 (12), pp. 7515-7523. [Currently displayed]

Details

Item typeArticle
Journal or Publication TitleNano Letters
Publisher:AMER CHEMICAL SOC
Open Access Type:Due to SHERPA/RoMEO
Place of Publication:WASHINGTON
Volume:18
Number of Issue or Book Chapter:12
Page Range:pp. 7515-7523
Date13 November 2018
InstitutionsPhysics > Institute of Experimental and Applied Physics > Chair Professor Huber > Group Rupert Huber
Identification Number
ValueType
10.1021/acs.nanolett.8b03008DOI
Keywords3-DIMENSIONAL TOPOLOGICAL INSULATOR; ANALYTICAL-MODEL; DIRAC PLASMONS; FLOQUET-BLOCH; SCATTERING; BI2TE3; SB2TE3; BI2SE3; PHOTOCURRENTS; SPECTROSCOPY; Near-field microscopy; SNOM; tomography; topological insulator; surface state; band bending
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
URN of the UB Regensburgurn:nbn:de:bvb:355-epub-380436
Item ID38043

Export bibliographical data

Owner only: item control page

nach oben