Go to content
UR Home

The Electronic Thickness of Graphene

Rickhaus, Peter , Liu, Ming-Hao , Kurpas, Marcin, Kurzmann, Annika, Lee, Yongjin, Overweg, Hiske, Eich, Marius, Pisoni, Riccardo, Tamaguchi, Takashi, Wantanabe, Kenji, Richter, Klaus, Ensslin, Klaus and Ihn, Thomas (2019) The Electronic Thickness of Graphene. arXiv.org. (Submitted)

[img]
Preview
PDF - Submitted Version
arXiv PDF (01.07.2019)
Download (2MB)
Date of publication of this fulltext: 15 Jul 2019 13:30

at arXiv


Abstract

The van-der-Waals stacking technique enables the fabrication of heterostructures, where two conducting layers are atomically close. In this case, the finite layer thickness matters for the interlayer electrostatic coupling. Here we investigate the electrostatic coupling of two graphene layers, twisted by 22 degrees such that the layers are decoupled by the huge momentum mismatch between the K and ...

plus


Export bibliographical data



Item type:Article
Date:1 July 2019
Institutions:Physics > Institute of Theroretical Physics > Chair Professor Richter > Group Klaus Richter
Projects:SFB 1277: Emergente relativistische Effekte in der Kondensierten Materie: Von grundlegenden Aspekten zu elektronischer Funktionalität
Identification Number:
ValueType
1907.00582arXiv ID
Dewey Decimal Classification:500 Science > 530 Physics
Status:Submitted
Refereed:No, this version has not been refereed yet (as with preprints)
Created at the University of Regensburg:Partially
Item ID:40498
Owner only: item control page

Downloads

Downloads per month over past year

  1. Homepage UR

University Library

Publication Server

Contact:

Publishing: oa@ur.de

Dissertations: dissertationen@ur.de

Research data: daten@ur.de

Contact persons