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The Electronic Thickness of Graphene

Rickhaus, Peter , Liu, Ming-Hao , Kurpas, Marcin, Kurzmann, Annika, Lee, Yongjin, Overweg, Hiske, Eich, Marius, Pisoni, Riccardo, Tamaguchi, Takashi, Wantanabe, Kenji, Richter, Klaus, Ensslin, Klaus and Ihn, Thomas (2019) The Electronic Thickness of Graphene. arXiv.org. (Submitted)

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arXiv PDF (01.07.2019)
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Date of publication of this fulltext: 15 Jul 2019 13:30

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The van-der-Waals stacking technique enables the fabrication of heterostructures, where two conducting layers are atomically close. In this case, the finite layer thickness matters for the interlayer electrostatic coupling. Here we investigate the electrostatic coupling of two graphene layers, twisted by 22 degrees such that the layers are decoupled by the huge momentum mismatch between the K and ...


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Item type:Article
Date:1 July 2019
Institutions:Physics > Institute of Theroretical Physics > Chair Professor Richter > Group Klaus Richter
Projects:SFB 1277: Emergente relativistische Effekte in der Kondensierten Materie: Von grundlegenden Aspekten zu elektronischer Funktionalität
Identification Number:
1907.00582arXiv ID
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:No, this version has not been refereed yet (as with preprints)
Created at the University of Regensburg:Partially
Item ID:40498
Owner only: item control page


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