Investigation of Electric Field Induced Ion Migration in Semiconductor Encapsulation Materials without the Interference of Electron Conductivity
Article
Schwab, S., Jung, J., Gruber, S., Bauer, M., Miethaner, S., Nelhiebel, M. and Hutter, H. (2016) Investigation of Electric Field Induced Ion Migration in Semiconductor Encapsulation Materials without the Interference of Electron Conductivity. ECS Journal of Solid State Science and Technology 5 (10), N72-N76.Alternative links to fulltext
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| Item type | Article | ||||
| Journal or Publication Title | ECS Journal of Solid State Science and Technology | ||||
| Volume | 5 | ||||
| Number of Issue or Book Chapter | 10 | ||||
| Page Range | N72-N76 | ||||
| Date | 2016 | ||||
| Date of publication | 17 Mar 2020 11:04 | ||||
| Institutions | UNSPECIFIED | ||||
| Identification Number |
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| Dewey Decimal Classification | UNSPECIFIED | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| Item ID | 42021 |
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