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Terahertz Magnetospectroscopy of Cyclotron Resonances from Topological Surface States in Thick Films of CdxHg1 – xTe

URN to cite this document:
urn:nbn:de:bvb:355-epub-446330
DOI to cite this document:
10.5283/epub.44633
Otteneder, Maximilian ; Sacré, Daniel ; Yahniuk, Ivan ; Diendorfer, Kilian ; Dmitriev, Ivan A. ; Ganichev, Sergey ; ,
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Date of publication of this fulltext: 27 Jan 2021 13:10

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Abstract

Herein, studies of the cyclotron resonance (CR) in thick CdxHg1-xTe films with different cadmium contents corresponding to materials with and without band inversion, as well as critical content corresponding to an almost linear energy dispersion are presented. The results demonstrate that the formation of 2D topological surface states requires sharp interfaces between layers with and without band ...

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