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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-446330
- DOI to cite this document:
- 10.5283/epub.44633
This publication is part of the DEAL contract with Wiley.
Abstract
Herein, studies of the cyclotron resonance (CR) in thick CdxHg1-xTe films with different cadmium contents corresponding to materials with and without band inversion, as well as critical content corresponding to an almost linear energy dispersion are presented. The results demonstrate that the formation of 2D topological surface states requires sharp interfaces between layers with and without band ...

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