Abstract
A simplified state model and associated rate equations are used to extract the reverse intersystem crossing and other key rate constants from transient photo-luminescence measurements of two high performance thermally activated delayed fluorescence materials. The values of the reverse intersystem crossing rate constant are in close agreement with established methods, but do not require a priori ...
Abstract
A simplified state model and associated rate equations are used to extract the reverse intersystem crossing and other key rate constants from transient photo-luminescence measurements of two high performance thermally activated delayed fluorescence materials. The values of the reverse intersystem crossing rate constant are in close agreement with established methods, but do not require a priori assumption of exponential decay kinetics, nor any additional steady state measurements. The model is also applied to measurements at different temperatures and found to reproduce previously reported thermal activation energies for the thermally activated delayed fluorescence process. Transient absorption measurements provide independent confirmation that triplet decay channels (neglected here) have no adverse effect on the fitting.
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