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Introducing a non-pixelated and fast centre of mass detector for differential phase contrast microscopy

Schwarzhuber, Felix ; Melzl, Peter ; Pöllath, Simon ; Zweck, Josef



Abstract

With the advent of probe corrected STEM machines it became possible to probe specimens on a scale of less than 50 pm resolution. This opens completely new horizons for research, as it is e.g. possible to probe the electrostatic fields between individual rows of atoms, using differential phase contrast (DPC). However, in contrast to conventional DPC, where one deals with extended fields which can ...

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