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Influence of combinatory effects of STEM setups on the sensitivity of differential phase contrast imaging

Lee, Gwangyeob ; Jeong, Juyoung ; Schwarzhuber, Felix ; Zweck, Josef ; Kim, Jeehoon ; Kim, Do Hyang ; Chang, Hye Jung


Differential phase-contrast (DPC) imaging in the scanning transmission electron microscopy (STEM) mode has been suggested as a new method to visualize the nanoscale electromagnetic features of materials. However, the quality of the DPC image is very sensitive to the electron-beam alignment, microscope setup, and specimen conditions. Unlike normal STEM imaging, the microscope setup variables in ...


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