Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment
Lechner, Lorenz, Gaaß, Markus, Paila, Antti, Sillanpää, Mika A., Strunk, Christoph
and Hakonen, Pertti J.
(2011)
Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment.
Nanotechnology 22 (12), p. 125203.
Date of publication of this fulltext: 19 Dec 2024 11:13
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| Item type | Article | ||||
| Journal or Publication Title | Nanotechnology | ||||
| Publisher: | IOP | ||||
|---|---|---|---|---|---|
| Place of Publication: | BRISTOL | ||||
| Volume: | 22 | ||||
| Number of Issue or Book Chapter: | 12 | ||||
| Page Range: | p. 125203 | ||||
| Date | 2011 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk | ||||
| Identification Number |
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| Keywords | CARBON NANOTUBES | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Partially | ||||
| Item ID | 65105 |
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