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Lechner, Lorenz ; Gaaß, Markus ; Paila, Antti ; Sillanpää, Mika A. ; Strunk, Christoph ; Hakonen, Pertti J.

Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment

Lechner, Lorenz, Gaaß, Markus, Paila, Antti, Sillanpää, Mika A., Strunk, Christoph and Hakonen, Pertti J. (2011) Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment. Nanotechnology 22 (12), p. 125203.

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Item typeArticle
Journal or Publication TitleNanotechnology
Publisher:IOP
Place of Publication:BRISTOL
Volume:22
Number of Issue or Book Chapter:12
Page Range:p. 125203
Date2011
InstitutionsPhysics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk
Identification Number
ValueType
10.1088/0957-4484/22/12/125203DOI
KeywordsCARBON NANOTUBES
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgPartially
Item ID65105

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