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Simulation of longitudinal instabilities in filamentary current flow during low‐temperature impurity breakdown in semiconductors

Murawski, J. ; Schwarz, G. ; Novák, V. ; Prettl, W. ; Schöll, E.



Abstract

Nonlinear semiconductor transport simulations based on the WIAS-TeSCA code are presented. Various regimes of low-temperature breakdown and current filamentation in n-GaAs are investigated using a drift-diffusion model with nonlinear generation-recombination kinetics, Nonlinear charge density waves are found in two-dimensional simulations of a point contact geometry with and without an additional ...

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