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Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe∕GaAs(001)-(4×6)
Giovanelli, L., Panaccione, G., Rossi, G., Fabrizioli, M., Tian, C. S., Gastelois, P. L.
, Fujii, J. and Back, C. H.
(2005)
Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe∕GaAs(001)-(4×6).
Applied Physics Letters 87 (4).
Date of publication of this fulltext: 19 Dec 2024 15:00
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| Item type | Article | ||||
| Journal or Publication Title | Applied Physics Letters | ||||
| Publisher: | AMER INST PHYSICS | ||||
|---|---|---|---|---|---|
| Place of Publication: | MELVILLE | ||||
| Volume: | 87 | ||||
| Number of Issue or Book Chapter: | 4 | ||||
| Date | 2005 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Chair Professor Back > Group Christian Back | ||||
| Identification Number |
| ||||
| Keywords | SUBSTRATE SURFACE RECONSTRUCTION; FE; GAAS(001); ANISOTROPY; DICHROISM; FILMS; SPECTROSCOPY; COBALT; | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| Item ID | 70598 |
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