; Elschenbroich, U. ; Ely, J. ; Fabbri, R. ; Fantoni, A. ; Fechtchenko, A. ; Felawka, L. ; Fox, B. ; Franz, J. ; Frullani, S. ; Gärber, Y. ; Gapienko, G. ; Gapienko, V. ; Garibaldi, F. ; Garutti, E. ; Gaskell, D. ; Gavrilov, G. ; Gharibyan, V. ; Graw, G. ; Grebeniouk, O. ; Greeniaus, L.G. ; Haeberli, W. ; Hafidi, K. ; Hartig, M. ; Hasch, D. ; Heesbeen, D. ; Henoch, M. ; Hertenberger, R. ; Hesselink, W.H.A. ; Hillenbrand, A. ; Holler, Y. ; Hommez, B. ; Iarygin, G. ; Ivanilov, A. ; Izotov, A. ; Jackson, H.E. ; Jgoun, A. ; Kaiser, R. ; Kinney, E. ; Kisselev, A. ; Königsmann, K. ; Kolster, H. ; Kopytin, M. ; Korotkov, V. ; Kozlov, V. ; Krauss, B. ; Krivokhijine, V.G. ; Lagamba, L.
; Lapikás, L. ; Laziev, A. ; Lenisa, P. ; Liebing, P. ; Lindemann, T. ; Lipka, K. ; Lorenzon, W. ; Ma, B.-Q. ; Makins, N.C.R. ; Marukyan, H. ; Masoli, F. ; Menden, F. ; Mexner, V. ; Meyners, N. ; Mikloukho, O. ; Miller, C.A. ; Miyachi, Y. ; Muccifora, V. ; Nagaitsev, A. ; Nappi, E. ; Naryshkin, Y. ; Nass, A. ; Nowak, W.-D. ; Oganessyan, K. ; Ohsuga, H. ; Orlandi, G. ; Potashov, S. ; Potterveld, D.H. ; Raithel, M. ; Reggiani, D. ; Reimer, P.E.
; Reischl, A. ; Reolon, A.R. ; Rith, K. ; Rosner, G. ; Rostomyan, A. ; Ryckbosch, D. ; Sanjiev, I. ; Savin, I. ; Scarlett, C. ; Schäfer, A. ; Schill, C. ; Schnell, G. ; Schüler, K.P. ; Schwind, A. ; Seidl, R. ; Seibert, J. ; Seitz, B. ; Shanidze, R. ; Shibata, T.-A. ; Shutov, V. ; Simani, M.C. ; Sinram, K. ; Stancari, M. ; Statera, M. ; Steffens, E. ; Steijger, J.J.M. ; Stewart, J. ; Stösslein, U. ; Tanaka, H. ; Taroian, S. ; Tchuiko, B. ; Terkulov, A.
; Tessarin, S. ; Thomas, E. ; Tkabladze, A. ; Trzcinski, A. ; Tytgat, M.
; Urciuoli, G.M. ; van der Nat, P. ; van der Steenhoven, G. ; van de Vyver, R. ; Vetterli, M.C.
; Vikhrov, V. ; Vincter, M.G.
; Visser, J. ; Vogel, C. ; Vogt, M. ; Volmer, J. ; Weiskopf, C. ; Wendland, J. ; Wilbert, J. ; Wise, T. ; Yen, S. ; Yoneyama, S. ; Zihlmann, B. ; Zohrabian, H. ; Zupranski, P. | Item type: | Article | ||||
|---|---|---|---|---|---|
| Journal or Publication Title: | Physics Letters B | ||||
| Publisher: | ELSEVIER SCIENCE BV | ||||
| Place of Publication: | AMSTERDAM | ||||
| Volume: | 562 | ||||
| Number of Issue or Book Chapter: | 3-4 | ||||
| Page Range: | pp. 182-192 | ||||
| Date: | 2003 | ||||
| Institutions: | Physics > Institute of Theroretical Physics > Chair Professor Schäfer > Group Andreas Schäfer | ||||
| Identification Number: |
| ||||
| Keywords: | DEEP-INELASTIC SCATTERING; ODD PARTON DISTRIBUTIONS; DRELL-YAN; EXCLUSIVE ELECTROPRODUCTION; HARD-SCATTERING; HERMES; LEPTOPRODUCTION; FRAGMENTATION; POLARIMETER; EVOLUTION; | ||||
| Dewey Decimal Classification: | 500 Science > 530 Physics | ||||
| Status: | Published | ||||
| Refereed: | Yes, this version has been refereed | ||||
| Created at the University of Regensburg: | Yes | ||||
| Item ID: | 72223 |
Abstract
Single-spin asymmetries have been measured for semi-inclusive electroproduction of pi(+), pi(-), pi(0) and K+ mesons in deep-inelastic scattering off a longitudinally polarised deuterium target. The asymmetries appear in the distribution of the hadrons in the azimuthal angle phi around the virtual photon direction, relative to the lepton scattering plane. The corresponding analysing powers in the ...

Abstract
Single-spin asymmetries have been measured for semi-inclusive electroproduction of pi(+), pi(-), pi(0) and K+ mesons in deep-inelastic scattering off a longitudinally polarised deuterium target. The asymmetries appear in the distribution of the hadrons in the azimuthal angle phi around the virtual photon direction, relative to the lepton scattering plane. The corresponding analysing powers in the sinphi moment of the cross section are 0.012 +/- 0.002(stat.) +/- 0.002(syst.) for pi(+), 0.006 +/- 0.003(stat.) +/- 0.002(syst.) for pi(-), 0.021 +/- 0.005(stat.) +/- 0.003(syst.) for pi(0) and 0.013 +/- 0.006(stat.) +/- 0.003(syst.) for K The sin 20 moments are compatible with zero for all particles. (C) 2003 Elsevier Science B.V All rights reserved.
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