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Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy
Fischer, P.
, Eimüller, T., Schütz, G., Denbeaux, G., Pearson, A., Johnson, L., Attwood, D., Tsunashima, S., Kumazawa, M., Takagi, N., Köhler, M. and Bayreuther, G.
(2001)
Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy.
Review of Scientific Instruments 72 (5), pp. 2322-2324.
Date of publication of this fulltext: 19 Dec 2024 15:52
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| Item type | Article | ||||
| Journal or Publication Title | Review of Scientific Instruments | ||||
| Publisher: | AMER INST PHYSICS | ||||
|---|---|---|---|---|---|
| Place of Publication: | MELVILLE | ||||
| Volume: | 72 | ||||
| Number of Issue or Book Chapter: | 5 | ||||
| Page Range: | pp. 2322-2324 | ||||
| Date | 2001 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Günther Bayreuther | ||||
| Identification Number |
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| Keywords | TRANSMISSION ELECTRON-MICROSCOPY; CIRCULAR-DICHROISM; PROBE; | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| Item ID | 73692 |
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