Optical transitions in strained Ge/Si superlattices

Schmidt, U., Humlícek, J., Lukes, F., Cardona, M., Presting, H., Kibbel, H., Kasper, E., Eberl, Karl, Wegscheider, Werner und Abstreiter, Gerhard (1992) Optical transitions in strained Ge/Si superlattices. Physical Review B 45 (12), S. 6793-6801.

PDF Download (1MB) - Nur für Mitarbeiter des Archivs

Zum Artikel beim Verlag (über DOI)

Zusammenfassung

Spectroscopic ellipsometry has been used to determine the dielectric functions of ultrathin Ge/Si superlattices with varying strain states and periodicity at room temperature. The E1-like transitions could be resolved with the multiple-angle-of-incidence technique and in a thick, Ge-rich sample; they split up into various contributions and start to absorb the light at lower energies than ...

Bibliographische Daten exportieren