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Optical transitions in strained Ge/Si superlattices

Schmidt, U., Humlícek, J., Lukes, F., Cardona, M., Presting, H., Kibbel, H., Kasper, E., Eberl, Karl, Wegscheider, Werner and Abstreiter, Gerhard (1992) Optical transitions in strained Ge/Si superlattices. Physical Review B 45 (12), pp. 6793-6801.

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Abstract

Spectroscopic ellipsometry has been used to determine the dielectric functions of ultrathin Ge/Si superlattices with varying strain states and periodicity at room temperature. The E1-like transitions could be resolved with the multiple-angle-of-incidence technique and in a thick, Ge-rich sample; they split up into various contributions and start to absorb the light at lower energies than ...

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Item type:Article
Date:1992
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1103/PhysRevB.45.6793DOI
Related URLs:
URLURL Type
http://link.aps.org/doi/10.1103/PhysRevB.45.6793Publisher
Classification:
NotationType
78.65.Gb, 73.20.DxPACS
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Item ID:9988
Owner only: item control page

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