High Resolution Imaging of Nanostructured Si/SiO2 Substrates and Cell Monolayers using Scanning Electrochemical Microscopy.
Bergner, S., Palatzky, P., Wegener, Joachim and Matysik, Frank-Michael (2010) High Resolution Imaging of Nanostructured Si/SiO2 Substrates and Cell Monolayers using Scanning Electrochemical Microscopy. Electroanalysis 23 (1), pp. 196-200.Date of publication of this fulltext: 23 Mar 2011 08:34
Article
Involved Institutions
Details
| Item type | Article |
| Journal or Publication Title | Electroanalysis |
| Publisher: | Wiley-VCH Verlag |
|---|---|
| Volume: | 23 |
| Number of Issue or Book Chapter: | 1 |
| Page Range: | pp. 196-200 |
| Date | 2010 |
| Institutions | Chemistry and Pharmacy > Institut für Analytische Chemie, Chemo- und Biosensorik > Bioanalytik und Biosensorik (Prof. Joachim Wegener) |
| Dewey Decimal Classification | 500 Science > 540 Chemistry & allied sciences |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 20250 |
Export bibliographical data
Owner only: item control page
More literature (via CORE)
More literature (via CORE)