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Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy

URN to cite this document:
urn:nbn:de:bvb:355-epub-220731
DOI to cite this document:
10.5283/epub.22073
Wutscher, Thorsten ; Giessibl, Franz J.
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Date of publication of this fulltext: 07 Sep 2011 08:31


Abstract

We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.


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