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Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy
Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.Date of publication of this fulltext: 07 Sep 2011 08:31
Article
DOI to cite this document: 10.5283/epub.22073
Abstract
We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.
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| Item type | Article | ||||||
| Journal or Publication Title | Review of Scientific Instruments | ||||||
| Publisher: | American Institute of Physics (AIP) | ||||||
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| Volume: | 82 | ||||||
| Number of Issue or Book Chapter: | 2 | ||||||
| Page Range: | 026106 | ||||||
| Date | 2011 | ||||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||||
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| Classification |
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| Keywords | atomic force microscopy; crystal faces; force sensors; image resolution; nickel compounds; specimen preparation | ||||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||||
| Status | Published | ||||||
| Refereed | Yes, this version has been refereed | ||||||
| Created at the University of Regensburg | Yes | ||||||
| URN of the UB Regensburg | urn:nbn:de:bvb:355-epub-220731 | ||||||
| Item ID | 22073 |
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