Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.
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Other URL: http://dx.doi.org/doi/10.1063/1.3549628
Abstract
We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.
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| Item type: | Article | ||||||
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| Date: | 2011 | ||||||
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||||
| Projects: | SFB 689: Spinphänomene in reduzierten Dimensionen | ||||||
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| Classification: |
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| Keywords: | atomic force microscopy; crystal faces; force sensors; image resolution; nickel compounds; specimen preparation | ||||||
| Dewey Decimal Classification: | 500 Science > 530 Physics | ||||||
| Status: | Published | ||||||
| Refereed: | Yes, this version has been refereed | ||||||
| Created at the University of Regensburg: | Yes | ||||||
| Item ID: | 22073 |
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