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Number of items at this level: 107.

2019

Seeholzer, Theresa , Gretz, Oliver , Giessibl, Franz J. and Weymouth, Alfred J. (2019) A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data. New Journal of Physics 21 (8), 083007.

Pürckhauer, Korbinian, Kirpal, Dominik, Weymouth, Alfred J. and Giessibl, Franz J. (2019) Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Revealing That Sulfur Is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions. ACS Applied Nano Materials 2 (5), pp. 2593-2598. Fulltext not available.

Liebig, Alexander and Giessibl, Franz J. (2019) In-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy. Applied Physics Letters 114, p. 143103.

2018

Sader, John E., Hughes, Barry D., Huber, Ferdinand and Giessibl, Franz J. (2018) Interatomic force laws that evade dynamic measurement. Nature Nanotechnology 13 (12), p. 1088. Fulltext not available.

Berwanger, Julian, Huber, Ferdinand, Stilp, Fabian and Giessibl, Franz J. (2018) Lateral manipulation of single iron adatoms by means of combined atomic force and scanning tunneling microscopy using CO-terminated tips. Physical Review B (PRB) 98 (19), p. 195409.

Pürckhauer, Korbinian , Weymouth, Alfred J. , Pfeffer, Katharina, Kullmann, Lars, Mulvihill, Estefania, Krahn, Michael P. , Müller, Daniel J. and Giessibl, Franz J. (2018) Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors. Scientific Reports 8 (1), p. 9330.

Okabayashi, Norio, Peronio, Angelo , Paulsson, Magnus, Arai, Toyoko and Giessibl, Franz J. (2018) Vibrations of a molecule in an external force field. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 115 (18), pp. 4571-4576. Fulltext not available.

2017

Gustafsson, Alexander, Okabayashi, Norio, Peronio, Angelo, Giessibl, Franz J. and Paulsson, Magnus (2017) Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study. Physical Review B 96 (8). Fulltext not available.

Huber, Ferdinand and Giessibl, Franz J. (2017) Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures. Review of Scientific Instruments 88 (7), 073702. Fulltext not available.

2016

Peronio, Angelo and Giessibl, Franz J. (2016) Attempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy. Physical Review B (PRB) 94 (094503), 094503.

Ooe, Hiroaki, Kirpal, Dominik, Wastl, Daniel S., Weymouth, Alfred J. , Toyoko, Arai and Giessibl, Franz J. (2016) Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy. Applied Physics Letters 109, p. 141603.

Okobayashi, Norio, Gustafsson, Alexander, Peronio, Angelo, Paulsson, Magnus, Arai, Toyoko and Giessibl, Franz J. (2016) Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory. Physical Review B (PRB) 93, pp. 165415-1.

2015

Huber, Ferdinand, Matencio, Sonia, Weymouth, Alfred J., Ocal, Carmen, Barrena, Esther and Giessibl, Franz J. (2015) Intramolecular Force Contrast and Dynamic Current-Distance Measurements at Room Temperature. Physical Review Letters 115 (6), 066101-1-066101-4.

Emmrich, Matthias (2015) Subatomare Auflösung auf Adatomen und kraftfeldabhängige laterale Manipulation mit einem eigenentwickelten Tieftemperatur-Rasterkraftmikroskop. PhD, Universität Regensburg.

Wastl, Daniel Sebastian (2015) Atomar aufgelöste Rasterkraftmikroskopie an Luft: Aufbau, Technik, Optimierung und Anwendung auf Graphit, Graphen, Kaliumbromid, Calcit und Molekülfilmen. PhD, Universität Regensburg.

Emmrich, Matthias, Huber, Ferdinand, Pielmeier, Florian, Welker, Joachim, Hofmann, Thomas, Schneiderbauer, Maximilian, Meuer, Daniel, Polesya, Svitlana, Mankovsky, Sergiy, Koedderitzsch, Diemo, Ebert, Hubert and Giessibl, Franz J. (2015) Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters. SCIENCE 348 (6232), pp. 308-311.

Emmrich, Matthias, Schneiderbauer, Maximilian, Huber, Ferdinand, Weymouth, Alfred J., Okabayashi, Norio and Giessibl, Franz J. (2015) Force Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM Tip. Physical Review Letters (PRL) 114, 146101-146101-5.

Wastl, Daniel S., Judmann, Michael, Weymouth, Alfred J. and Giessibl, Franz J. (2015) Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips. ACS Nano 9 (4), pp. 3858-3865. Fulltext not available.

Wurster, Eva-Christina, Liebl, Renate, Michaelis, Stefanie, Robelek, Rudolf, Wastl, Daniel S., Giessibl, Franz J., Goepferich, Achim and Breunig, Miriam (2015) Oligolayer-Coated Nanoparticles: Impact of Surface Topography at the Nanobio Interface. ACS applied materials & interfaces 7, pp. 7891-7900. Fulltext not available.

Pielmeier, Florian, Landolt, Gabriel, Slomski, Bartosz, Muff, Stefan, Berwanger, Julian, Eich, Andreas, Khajetoorians, Alexander A., Wiebe, Jens, Aliev, Ziya S., Babanly, Mahammad B., Wiesendanger, Roland, Osterwalder, Jürg, Chulkov, Evgueni V., Giessibl, Franz J. and Dil, J . Hugo (2015) Response of the topological surface state to surface disorder in TIBiSe2. New Journal of Physics 17, 023067.

Ionescu, Andrei, Brambilla, Eugenio, Wastl, Daniel S., Giessibl, Franz J., Cazzaniga, Gloria, Schneider-Feyrer, Sibylle and Hahnel, Sebastian (2015) Influence of matrix and filler fraction on biofilm formation on the surface of experimental resin-based composites. Journal of Materials Science: Materials in Medicine 26, p. 58. Fulltext not available.

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland and Meyer, Ernst, eds. (2015) Noncontact Atomic Force Microscopy: Volume 3. NanoScience and Technology, (12). Springer. ISBN Hardcover 978-3-319-15587-6; eBook ISBN 978-3-319-15588-3. Fulltext not available.

Wurster, Eva-Christina, Liebl, Renate, Michaelis, Stefanie, Robelek, Rudolf, Wastl, Daniel S., Giessibl, Franz J., Göpferich, Achim and Breunig, Miriam (2015) Oligolayer-coated nanoparticles: impact of surface topography at the nanobio interface. ACS Applied Materials & Interfaces 7 (15), pp. 7891-7900. Fulltext not available.

2014

Schneiderbauer, Maximilian (2014) Aufbau eines Tieftemperatur-Ultrahochvakuum-Rasterkraftmikroskops und Messung elektrischer Multipolkräfte im Piconewton-Bereich. PhD, Universität Regensburg.

Pielmeier, Florian (2014) Atomic force microscopy in the picometer regime - resolving spins and non-trivial surface terminations. PhD, Universität Regensburg.

Hahnel, Sebastian, Wastl, Daniel S., Schneider-Feyrer, Sibylle, Giessibl, Franz J., Brambilla, Eugenio, Cazzaniga, Gloria and Ionescu, Andrei (2014) Streptococcus mutans biofilm formation and release of fluoride from experimental resin-based composites depending on surface treatment and S-PRG filler particle fraction. The journal of adhesive dentistry (JAD) 16 (4), pp. 313-321. Fulltext not available.

Hofmann, Thomas (2014) Hochauflösende Rasterkraftmikroskopie auf Graphen und Kohlenmonoxid. Dissertationsreihe der Fakultät für Physik der Universität Regensburg 37, PhD, Universität Regensburg.

Schneiderbauer, Maximilian, Emmrich, Matthias, Weymouth, Alfred J. and Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy
Contrast via Short-Range Electrostatic Forces.
Physical Review Letters (PRL) 112, 166102-1-166102-5.

Wastl, Daniel S., Weymouth, Alfred J. and Giessibl, Franz J. (2014) Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy. ACS NANO 8 (5), pp. 5233-5239. Fulltext not available.

Pielmeier, Florian, Meuer, Daniel, Schmid, Daniel R., Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. Beilstein Journal of Nanotechnology (5), pp. 407-412. Fulltext not available.

Hofmann, Thomas, Pielmeier, Florian and Giessibl, Franz J. (2014) Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy. Physical Review Letters (PRL) 112 (6), 066101-1-066101-5. Fulltext restricted.

Weymouth, Alfred J., Hofmann, Thomas and Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy. Science 343 (6175), 1120-1-1120-5.

2013

Wastl, Daniel S., Speck, Florian, Wutscher, Elisabeth, Ostler, Markus, Seyller, Thomas and Giessibl, Franz J. (2013) Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air. ACS Nano 7 (11), pp. 10032-10037. Fulltext not available.

Weymouth, Alfred J., Meuer, Daniel, Mutombo, Pingo, Wutscher, Thorsten, Ondracek, Martin, Jelinek, Pavel and Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction. Physical Review Letters 111 (12), p. 126103. Fulltext not available.

Welker, Joachim, Weymouth, Alfred J. and Giessibl, Franz J. (2013) The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy. ACS NANO 7 (8), pp. 7377-7382. Fulltext not available.

Wutscher, Thorsten, Niebauer, Johannes and Giessibl, Franz J. (2013) Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers. Review of Scientific Instruments 84, 073704-1.

Pielmeier, Florian and Giessibl, Franz J. (2013) Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy. Physical Review Letters (PRL) 110 (26), 266101-1-266101-5.

Giessibl, Franz J. (2013) Seeing the Reaction. Science 340 (6139), pp. 1417-1418.

Wastl, Daniel S., Weymouth, Alfred J. and Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B (PRB) 87 (24), 245415-1-245415-10.

Welker, Joachim (2013) Höchstauflösende Kraftmikroskopie mit subatomar definierten Bindungszuständen. Dissertationsreihe der Fakultät für Physik der Universität Regensburg 30, PhD, Universität Regensburg.

Wutscher, Thorsten (2013) Untersuchung der Kopplung von atomaren Strömen und atomaren Kräften durch die Rastersondenmikroskopie. PhD, Universität Regensburg.

Welker, Joachim and Giessibl, Franz J. (2013) Abbildung der Symmetrien chemischer Bindungen. , Regensburg.

2012

Weymouth, Alfred Jay and Giessibl, Franz J. (2012) The effect of sample resistivity on Kelvin probe force microscopy. Applied Physics Letters 101, pp. 213105-1.

Ionescu, Andrei, Wutscher, Elisabeth, Brambilla, Eugenio, Schneider-Feyrer, Sibylle, Giessibl, Franz J. and Hahnel, Sebastian (2012) Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development. European Journal Of Oral Sciences 120 (5), pp. 458-465. Fulltext not available.

Wutscher, Elisabeth (2012) Dynamische Rasterkraftmikroskopie mit kleinen Amplituden an Luft und in Flüssigkeiten. PhD, Universität Regensburg.

Wutscher, Thorsten, Weymouth, Alfred J. and Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current. Physical Review B (PRB) 85 (19), 195426-1-195426-6.

Welker, Joachim and Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy. Science 336 (608), pp. 444-449.

Welker, Joachim, Illek, Esther and Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein Journal of Nanotechnology 3, pp. 238-248.

Schneiderbauer, Maximilian, Wastl, Daniel S. and Giessibl, Franz J. (2012) qPlus magnetic force microscopy in frequencymodulation mode with millihertz resolution. Beilstein Journal of Nanotechnology 3, pp. 174-178.

2011

Giessibl, Franz J., Pielmeier, Florian, Eguchi, Toyoaki, An, Toshu and Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Physical Review B (PRB) 84 (12), 125409-1-125409-15.

Weymouth, Alfred J., Wutscher, Thorsten, Welker, Joachim, Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), 226801-1-226801-4.

Ternes, Markus, González, César, Lutz, Christopher P., Hapala, Prokop, Giessibl, Franz J., Jelinek, Pavel and Heinrich, Andreas J. (2011) Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts. Physical Review Letters (PRL) 106 (1), 016802-1-016802-4.

Welker, Joachim, de Faria Elsner, Frederico and Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks. Applied Physics Letters 99, 084102.

Wutscher, Elisabeth and Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. Review of Scientific Instruments 82, 093703.

Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.

2010

Tung, Raimond C., Wutscher, Thorsten, Martinez-Martin, David, Reifenberger, Ronald G., Giessibl, Franz J. and Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. Journal of Applied Physics 107 (10), 104508-1-104508-8.

Hofmann, Thomas, Welker, Joachim and Giessibl, Franz J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination. Journal of Vacuum Science & Technology B 28 (3), C4E28-C4E30.

2009

Giessibl, Franz J. (2009) Auf die Spitze getrieben. Physik Journal 8 (11), pp. 20-21. Fulltext not available.

Gross, Leo, Mohn, Fabian, Meyer, Gerhard, Repp, Jascha and Giessibl, Franz J. (2009) Atomare Ladungszustände unter dem Rasterkraftmikroskop. Physik in unserer Zeit 40 (5), pp. 225-226. Fulltext not available.

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy: Volume 2. NanoScience and Technology. Springer, Heidelberg, Berlin. ISBN Hardcover 978-3-642-01494-9; eBook ISBN 978-3-642-01495-6; Softcover ISBN: 978-3-642-26070-4. Fulltext not available.

2008

Ternes, Markus, Heinrich, Andreas J. and Giessibl, Franz J. (2008) Wie viel Kraft ist nötig, um ein Atom zu bewegen? Physik in unserer Zeit 39 (3), pp. 111-112.

Ternes, Markus, Lutz, Christopher P., Hirjibehedin, Cyrus F., Giessibl, Franz J. and Heinrich, Andreas J. (2008) The Force Needed to Move an Atom on a Surface. Science 319 (5866), pp. 1066-1069.

Schmid, Martin, Mannhart, Jochen and Giessibl, Franz J. (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Physical Review B (PRB) 77 (4), 045402-1-045402-6.

2007

Giessibl, Franz J. (2007) Ein atomarer Fingerabdruck. Physik Journal 6 (5), pp. 22-23. Fulltext not available.

2006

Giessibl, Franz J. and Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy. Physics today 59 (12), pp. 44-50. Fulltext not available.

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701. Fulltext not available.

Schmid, Martin, Renner, Andreas and Giessibl, Franz J. (2006) Device for in situ cleaving of hard crystals. Review of Scientific Instruments 77 (3), 036101-1-036101-7.

Baier, Jürgen (2006) Lumineszenz-Untersuchungen zur Generierung und Relaxation von Singulett-Sauerstoff in zellulärer Umgebung. PhD, Universität Regensburg.

Zotti, Linda A., Hofer, Werner A. and Giessibl, Franz J. (2006) Electron scattering in scanning probe microscopy experiments. Chemical Physics Letters 420 (1-3), pp. 177-182.

2005

Manz, Thomas (2005) Stimulierte Stokes- und anti-Stokes-Raman-Streuung mit Bessel-Bündeln in Aceton und Wasserstoff. PhD, Universität Regensburg.

Giessibl, Franz J. (2005) AFM's path to atomic resolution. Materials Today 8 (5), pp. 32-41.

Herz, Markus, Schiller, Christian H., Giessibl, Franz J. and Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), 153101-1-153101-3.

Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen and Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite. Physical Review Letters (PRL) 94 (5), 056101-1-056101-4.

Giessibl, Franz J. and Reichling, Michael (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor. Nanotechnology 16 (3), pp. 118-124.

Morita, Seizo, Giessibl, Franz J., Sugawara, Yasuhiro, Hosoi, Hirotaka, Mukasa, Koichi, Sasahara, Akira and Onishi, Hiroshi (2005) 13. Noncontact Atomic Force Microscopy and its Related Topics. In: Bhushan, Bharat, (ed.) Nanotribology and Nanomechanics An Introduction. Springer, Berlin, pp. 385-411. ISBN 978-3-540-24267-3. Fulltext not available.

2004

Hembacher, Stefan, Giessibl, Franz J. and Mannhart, Jochen (2004) Force Microscopy with Light-Atom Probes. Science 305 (5682), pp. 380-383.

Giessibl, Franz J., Hembacher, Stefan, Herz, Markus, Schiller, C. H. and Mannhart, Jochen (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15 (2), pp. 79-86.

Giessibl, Franz J. (2004) Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy. In: Siffert, Paul and Krimmel, E. F., (eds.) Silicon : evolution and future of a technology. Springer, Berlin, pp. 191-204. ISBN 3-540-40546-1. Fulltext not available.

2003

Giessibl, Franz J. (2003) Atomic Force Microscopy on Its Way to Adolescence. AIP Conference Proceedings 696 (1), pp. 60-67. Fulltext not available.

Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen and Quate, Calvin F. (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), pp. 12539-12542.

Giessibl, Franz J. (2003) Advances in Atomic Force Microscopy. Reviews of Modern Physics (RMP) 75 (3), pp. 949-983.

Herz, Markus, Giessibl, Franz J. and Mannhart, F. (2003) Probing the shape of atoms in real space. Physical Review B (PRB) 68 (4), 045301-1-045301-7.

Engl, Roland (2003) Die Erzeugung und Relaxation von Singulett-Sauerstoff in homogenen Lösungen sowie Lipid- und Zellsuspensionen. PhD, Universität Regensburg.

Giessibl, Franz J. (2003) B2. Principle of High-Resolution Atomic Force Microscopy. In: Blügel, Stefan and Luysberg, Martina and Urban, Knut and Waser, Rainer, (eds.) Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung. Schriften des Forschungszentrums Jülich : Reihe Materie und Material, 14 (B2). Forschungszentrum, Zentralbibliothek, Jülich. ISBN 3-89336-319-X. Fulltext not available.

2002

Giessibl, Franz J., Herz, Markus and Mannhart, Jochen (2002) Friction traced to the single atom. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 99 (19), pp. 12006-12010.

Hembacher, Stefan, Giessibl, Franz J. and Mannhart, Jochen (2002) Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum. Applied Surface Science 188 (3-4), pp. 445-449.

Giessibl, Franz J. (2002) 2. Principle of NC-AFM. In: Morita, Seizo and Wiesendanger, Roland and Meyer, Ernst, (eds.) Noncontact atomic force microscopy. Band 1. Nanoscience and technology (2). Springer, Berlin, pp. 11-46. ISBN 3-540-43117-9. Fulltext not available.

Giessibl, Franz J. (2002) Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals. In: Proceedings of the Scanning Probe Microscopy-2002 (SPM-2002) Workshop : 3 March - 6 March 2002, Nizhny Novgorod, Russia. Physics of low-dimensional structures, 2002,5/6. VSV, Moskau, pp. 172-174. Fulltext not available.

2001

Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan and Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations. Annalen der Physik 10 (11-12), pp. 887-910.

Giessibl, Franz J. (2001) Rasterkraftmikroskop sieht erstmals ins Innere des Atoms. Spektrum der Wissenschaft 2001 (April), pp. 12-14. Fulltext not available.

Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut and Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips. Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17.

Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters 78 (1), pp. 123-125.

2000

Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut and Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), pp. 422-425.

Giessibl, Franz J. and Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), pp. 9968-9971.

Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters 76 (11), pp. 1470-1472.

1999

Bielefeldt, Hartmut and Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867.

Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357.

Giessibl, Franz J. (1999) Force Microscopy in Vacuum with Atomic Resolution. In: Kuk, Y. and Lyo, I.W. and Jeon, D. and Park, S. I., (eds.) Preliminary proceedings of STM : 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy ; 19 - 23 July, 1999, Seoul, Korea. , pp. 19-20. Fulltext not available.

1998

Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters 73 (26), pp. 3956-3958.

1997

Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Physical Review B (PRB) 56 (24), pp. 16010-16015.

Giessibl, Franz J. and Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Applied Physics Letters 70 (19), pp. 2529-2531.

1995

Giessibl, Franz J. (1995) Atomic Force Microscopy-(7x7) Surface by Atomic Force Microscopy. Science 267 (5194), pp. 68-71.

1994

Giessibl, Franz J. (1994) Atomic Force Microscopy in Ultrahigh Vacuum. Japanese Journal of Applied Physics (JJAP) 33, Part 1 (6B), pp. 3726-3734. Fulltext not available.

Giessibl, Franz J. and Trafas, Brian M. (1994) Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum. Review of Scientific Instruments 65 (6), pp. 1923-1929.

1992

Giessibl, Franz J. and Binnig, Gerd (1992) Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum. Ultramicroscopy 42-44 pt.1, pp. 281-289.

Giessibl, Franz J. and Binnig, Gerd (1992) Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy. Physical Review B (PRB) 45 (23), 13815(R).

1991

Giessibl, Franz J., Gerber, Christoph and Binnig, Gerd (1991) A low‐temperature atomic force/scanning tunneling microscope for ultrahigh vacuum. Journal of Vacuum Science and Technology B 9 (2), pp. 984-988.

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