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Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

URN to cite this document:
urn:nbn:de:bvb:355-epub-229222
Wutscher, Elisabeth ; Giessibl, Franz J.
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Date of publication of this fulltext: 12 Dec 2011 08:26


Abstract

We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor, a force sensor based on a quartz tuning fork with an all-electrical deflection measurement scheme. Small amplitudes, stiff sensors with bulk diamond tips and high Q values in air and liquid allow to obtain high resolution images. The noise sources in air and liquid are analyzed and compared for ...

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