Go to content
UR Home

Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

URN to cite this document:
DOI to cite this document:
Wutscher, Elisabeth ; Giessibl, Franz J.
License: Allianz- bzw. Nationallizenz
PDF - Published Version
Date of publication of this fulltext: 12 Dec 2011 08:26


We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor, a force sensor based on a quartz tuning fork with an all-electrical deflection measurement scheme. Small amplitudes, stiff sensors with bulk diamond tips and high Q values in air and liquid allow to obtain high resolution images. The noise sources in air and liquid are analyzed and compared for ...


Owner only: item control page
  1. Homepage UR

University Library

Publication Server


Publishing: oa@ur.de
0941 943 -4239 or -69394

Dissertations: dissertationen@ur.de
0941 943 -3904

Research data: datahub@ur.de
0941 943 -5707

Contact persons