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Forces and frequency shifts in atomic-resolution dynamic-force microscopy

URN to cite this document:
urn:nbn:de:bvb:355-epub-252727
Giessibl, Franz J.
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Date of publication of this fulltext: 05 Jul 2012 05:57


Abstract

True atomic resolution in vacuum with a force microscope is now obtained routinely by using the frequency shift of an oscillating cantilever as the imaging signal. Here, a calculation is presented that relates the frequency shift to the forces between tip and sample for both large and small oscillation amplitudes. Also, the frequency versus distance data for van der Waals dominated tip-sample ...

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