Higher-harmonic atomic force microscopy
Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701.Date of publication of this fulltext: 10 Jul 2012 14:04
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| Item type | Article | ||||
| Journal or Publication Title | Surface and Interface Analysis | ||||
| Publisher: | John Wiley & Sons | ||||
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| Volume: | 38 | ||||
| Number of Issue or Book Chapter: | 12-13 | ||||
| Page Range: | pp. 1696-1701 | ||||
| Date | 29 November 2006 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
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| Keywords | atomic force microscopy; sub–Angstrom spatial resolution; higher harmonics; qPlus sensor | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Unknown | ||||
| Created at the University of Regensburg | Unknown | ||||
| Item ID | 25319 |
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