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Higher-harmonic atomic force microscopy

Giessibl, Franz J.



Abstract

To maximize the spatial resolution of atomic force microscopy (AFM), it is helpful to isolate the spurious short-range components from the plethora of force contributions acting between AFM tips and samples. It is shown theoretically and experimentally that higher-harmonic AFM, a technique that utilizes the anharmonic deflection contributions that arise when a cantilever oscillates in the highly ...

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