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Higher-harmonic atomic force microscopy

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701.

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To maximize the spatial resolution of atomic force microscopy (AFM), it is helpful to isolate the spurious short-range components from the plethora of force contributions acting between AFM tips and samples. It is shown theoretically and experimentally that higher-harmonic AFM, a technique that utilizes the anharmonic deflection contributions that arise when a cantilever oscillates in the highly ...


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Item type:Article
Date:29 November 2006
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
Keywords:atomic force microscopy; sub–Angstrom spatial resolution; higher harmonics; qPlus sensor
Dewey Decimal Classification:500 Science > 530 Physics
Created at the University of Regensburg:Unknown
Item ID:25319
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