A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-253250
DOI to cite this document:: 10.5283/epub.25325

Giessibl, Franz J.

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Date of publication of this fulltext: 10 Jul 2012 14:17

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Abstract

Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the tip–sample forces are not directly accessible by FMAFM. Here, an algorithm to recover the tip–sample forces from the frequency shift curve is introduced and demonstrated with experimental data. Also, an intuititive connection between frequency ...