Giessibl, Franz J. (2003) B2. Principle of High-Resolution Atomic Force Microscopy. In: Blügel, Stefan and Luysberg, Martina and Urban, Knut and Waser, Rainer, (eds.) Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung. Schriften des Forschungszentrums Jülich : Reihe Materie und Material, 14 (B2). Forschungszentrum, Zentralbibliothek, Jülich. ISBN 3-89336-319-X.
Full text not available from this repository.
Export bibliographical data
| Item type: | Book section |
|---|---|
| Date: | 2003 |
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Dewey Decimal Classification: | 500 Science > 530 Physics |
| Status: | Published |
| Refereed: | Unknown |
| Created at the University of Regensburg: | Unknown |
| Item ID: | 25331 |
Owner only: item control page
CORE (COnnecting REpositories)
CORE (COnnecting REpositories)