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Principle of High-Resolution Atomic Force Microscopy
Giessibl, Franz J. (2003) B2. Principle of High-Resolution Atomic Force Microscopy. In: Blügel, Stefan and Luysberg, Martina and Urban, Knut and Waser, Rainer, (eds.) Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung. Schriften des Forschungszentrums Jülich : Reihe Materie und Material, 14 (B2). Forschungszentrum, Zentralbibliothek, Jülich. ISBN 3-89336-319-X.Date of publication of this fulltext: 10 Jul 2012 14:29
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| Item type | Book section |
| ISBN | 3-89336-319-X |
| Title of Book: | Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung |
|---|---|
| Publisher: | Forschungszentrum, Zentralbibliothek |
| Place of Publication: | Jülich |
| Other Series: | Schriften des Forschungszentrums Jülich : Reihe Materie und Material |
| Volume: | 14 |
| Number of Issue or Book Chapter: | B2 |
| Date | 2003 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Unknown |
| Created at the University of Regensburg | Unknown |
| Item ID | 25331 |
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